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Springer Series In Optical Seiences Volume 45 Edited By ...
physics of image formation and microanalysis by l. reimer forms a counterpart to transmission electron microscopy vol. 36 of this springer series in optical sciences . the book evolved from lectures delivered at the university of munster and from a german text entitled raster
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electron microscopy physics of image formation and microanalysis. springer verlag ber lin heidelberg new york tokyo 1985 pp . 457 springer series in optical sciences v.. 45. the book examines the physical bases of the methods of scanning electron microscop an x rad y microanalysiy s which refer to electron probe method osf studying
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the reimer text scanning electron microscopy physics of image formation and microanalysis discusses the physics of imaging and microanslysis and approaches the subject in a elegant but terse manner. it is at the same or more advanced level than the goldstein text. author reimer ludwig 1928 title scanning electron microscopy physics of
Springer Series In Optical Sciences Volume 72
43 x ray microscopy editors g. schmahl and d. rudolph 44 introduction to laser physics by k. shimoda 2nd edition 45 scanning electron microscopy physics of image formation and microanalysis by l. reimer 2nd edition 46 holography and deformation analysis by w. schumann j. p. zurcher and d. cuche 47 tunable solid state lasers
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